Automated information and visualization system for optical control of ultra thin microcables

Abstract

The paper highlights the analyzed types of critical and minor defects in flexible Al-Pi microcables and developed their systematization. A thorough and detailed study of methods for detecting defects, obtaining and processing information was conducted, it allowed us to select optimal approaches for automated optical inspection. A structural diagram of an optical inspection system (OIS) has been developed, it provides effective detection of defects in flexible ultrathin microcables used in sensor modules and digital track detector calorimeters. The technical support and equipment of the OIS workplace were also provided, including modern means of optical analysis and computer data processing.

The OIS, an automated optical inspection system, was created, it can be used in production and it has a wide range of functions and characteristics making it possible to detect effectively various surface defects while ensuring high quality and reliability of flexible ultrathin Al-Pi microcables. In the process of work, modern methods for improving the accuracy and speed of optical control of the developed and tested system were analyzed, they allowed us to identify promising areas for further improvement of the system.