Статистический анализ влияния трафарета на разброс номиналов ТП-резисторов на подложке

Authors

  • В.П. Николаев

Abstract

Рассматриваются результаты исследования, проведенного методами статистического анализа, влияния трафарета на разброс номиналов ТП резисторов по подложке. Построена регрессия вероятности отбраковки модуля в зависимости от среднего значения резистора по поверхности модуля. Определены области и величина коррекции ширины прорезей трафарета. Предложены варианты коррекции при изготовлении фотошаблонов, позволяющие увеличить выход годных на 2,5 +4%.

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How to Cite

Николаев, В. Статистический анализ влияния трафарета на разброс номиналов ТП-резисторов на подложке. Radiotekhnika, 4(19), 173–176. Retrieved from http://rt.nure.ua/article/view/210356

Issue

No. 19 (1971): Radiotekhnika

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Articles

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