Hryha, V.M., V.M. Vintoniak, and V.S. Hula. “MOSFET Transistor Modeling Including Parasitic Leakage and Drain Resistance”. Radiotekhnika, no. 222 (September 18, 2025): 219–227. Accessed December 5, 2025. http://rt.nure.ua/article/view/343584.